Spectroscopic Ellipsometer by SENTECH Ellipsometry
Laser-Driven Light Sources for Ellipsometry
Laser Ellipsometer for thickness measurement by SENTECH
Fast IR laser mapping ellipsometry for the study of functional organic thin films - Analyst (RSC Publishing) DOI:10.1039/C4AN01853B
Terahertz time-domain ellipsometry with high precision for the evaluation of GaN crystals with carrier densities up to 1020 cm−3 | Scientific Reports
Laser ellipsometer by SENTECH
Infrared-spectroscopic single-shot laser mapping ellipsometry: Proof of concept for fast investigations of structured surfaces and interactions in organic thin films - ScienceDirect
The scanning laser ellipsometer MicroScan allows local measurements and... | Download Scientific Diagram
Rudolph AutoEL III Automatic Laser Ellipsometer -Works but has Funky Optics
Laser ellipsometer by SENTECH
Spectroscopic Ellipsometer - The new SENresearch 4.0